Can anyone help me to understand how does the Tessent ESOE work? To diagnose a failure on silicon, I understand that each data collection procedure consists of the following three patterns:
- Initialize diagnostic pattern - what to be initialized?
- Execute diagnostic pattern - "execute and get failing cycles" what does the "cycle" mean here?
- Increment diagnostic pattern - what to be incremented? move on to next address? move on to next memory?
Thanks in advanced for those who provide answers.
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